Proceedings of the ... IEEE VLSI Test Symposium : VTS
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Proceedings of the ... IEEE VLSI Test Symposium : VTS
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| Genre | |
|---|---|
| Other Titles |
IEEE VLSI Test Symposium IEEE Very Large Scale Integration Test Symposium VLSI Test Symposium Very Large Scale Integration Test Symposium VTS Proceedings ... IEEE ... VLSI Test Symposium |
| Language |
English |
| Publisher |
[Los Alamitos, Calif.] :
[IEEE Computer Society Press]
|
| Classification | |
| Dewey Classification |
621 |
| Subjects | |
| Subseries |
2010 28th VLSI Test Symposium (VTS) 29th VLSI Test Symposium 2013 IEEE 31st VLSI Test Symposium (VTS) |
| Additional form |
1093-0167 |
| Publish date |
Print began with 12th (1994) |
| Publication Frequency |
Annual |
| System requirements |
Mode of access: World Wide Web |
| ISSN |
2375-1053 |
| Related Items |
Original print version of this title was preceded by an earlier title called: IEEE VLSI Test Symposium. Digest of papers. |
| Notes |
Print version sponsored by the IEEE Computer Society Technical Committee on Test Technology [and] IEEE Philadelphia Section |
| Get full text | |