Proceedings of the ... IEEE VLSI Test Symposium : VTS
Finna-recension
Proceedings of the ... IEEE VLSI Test Symposium : VTS
Sparad:
| Genre | |
|---|---|
| Andra titlar |
IEEE VLSI Test Symposium IEEE Very Large Scale Integration Test Symposium VLSI Test Symposium Very Large Scale Integration Test Symposium VTS Proceedings ... IEEE ... VLSI Test Symposium |
| Språk |
engelska |
| Utgivare |
[Los Alamitos, Calif.] :
[IEEE Computer Society Press]
|
| Klassifikation | |
| DDK-klassifikation |
621 |
| Ämnen | |
| Underserie |
2010 28th VLSI Test Symposium (VTS) 29th VLSI Test Symposium 2013 IEEE 31st VLSI Test Symposium (VTS) |
| Annan form |
1093-0167 |
| Publicerad |
Print began with 12th (1994) |
| Utgivningsfrekvens |
Annual |
| Systemkrav |
Mode of access: World Wide Web |
| ISSN |
2375-1053 |
| Relaterade poster |
Original print version of this title was preceded by an earlier title called: IEEE VLSI Test Symposium. Digest of papers. |
| Anmärkningar |
Print version sponsored by the IEEE Computer Society Technical Committee on Test Technology [and] IEEE Philadelphia Section |
| Hämta fulltext | |