Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

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E-tidskrift

Institute of Electrical and Electronics Engineers ; IEEE Xplore (Online service)

IEEE

Sparad:

Genre

Conference papers and proceedings

Andra titlar

Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation & Test
VLSI-DAT ..
International Symposium on VLSI Design, Automation & Test
IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT)

Språk

engelska

Utgivare

Piscataway, NJ : IEEE

Klassifikation

dlc ISSN RECORD

DDK-klassifikation

621

Ämnen

Integrated circuits → Very large scale integration → Design and construction → Congresses.

Integrated circuits → Very large scale integration → Testing → Congresses.

Integrated circuits → Very large scale integration → Congresses.

Integrated circuits → Very large scale integration.

Integrated circuits → Very large scale integration → Design and construction.

Integrated circuits → Very large scale integration → Testing.

Publicerad

Began with: 2005.

Utgivningsfrekvens

Annual

ISSN

2472-9124

Förvärvskälla

IEEE, 445 Hoes Lane, Piscataway, NJ 08854-4141

Okontrollerad titel

IEEE/IET Electronic Library (IEL)

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Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

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Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

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