IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

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Periodisk e-publikation

Institute of Electrical and Electronics Engineers

Sparad:

Genre

Conference papers and proceedings

Andra titlar

International Conference on Computational Intelligence for Measurement Systems and Applications
Computational intelligence for measurement systems and applications
CIMSA proceedings

Språk

engelska

Utgivare

Piscataway, N.J. : Institute of Electrical and Electronics Engineers

Klassifikation

dlc ISSN RECORD

DDK-klassifikation

006

Ämnen

Computational intelligence → Industrial applications → Congresses.

Neural networks (Computer science) → Congresses.

Fuzzy systems → Congresses.

Soft computing → Congresses.

Automatic control → Data processing → Congresses.

Measurement → Congresses.

Automatic control → Data processing.

Computational intelligence → Industrial applications.

Fuzzy systems.

Measurement.

Neural networks (Computer science)

Soft computing.

Underserie

2011 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (CIMSA) Proceedings
2012 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (CIMSA) Proceedings

Annan form

2159-1547

Fortsättes av

Computational Intelligence and Virtual Environments for Measurement Systems and Applications, IEEE International Conference on
... IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications

Publicerad

Began in 2004; ceased in 2012.

ISSN

2159-1555

Förvärvskälla

IEEE, 445 Hoes Ln. Piscataway NJ 08854

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IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

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Materialet erbjuds av

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IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : [proceedings]

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