Proceedings of the ... International Conference on Microelectronic Test Structures
Finna-arvio
Proceedings of the ... International Conference on Microelectronic Test Structures
Tallennettuna:
| Genre | |
|---|---|
| Muut nimekkeet |
Proceedings ICMTS International Conference on Microelectronic Test Structures proceedings IEEE International Conference on Microelectronic Test Structures proceedings |
| Kieli |
englanti |
| Julkaisija |
New York, N.Y. :
Institute of Electrical and Electronics Engineers
|
| Luokitus | |
| Dewey-luokitus |
621 621 |
| Aiheet | |
| Lisätiedot | IEEE International Conference on Microelectronic Test Structures |
| Alasarja |
2011 IEEE ICMTS International Conference on Microelectronic Test Structures 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2014 International Conference on Proceedings of the 2015 International Conference on Microelectronic Test Structures |
| Muu ilmiasu |
1071-9032 |
| Julkaistu |
1989- |
| Julkaisutiheys |
Annual |
| Järjestelmävaatimukset |
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002 |
| ISSN |
2158-1029 |
| Hankintapaikka |
IEEE, 445 Hoes Ln., Piscataway NJ 08854 |
| Huomautukset |
Vols. for 1989 sponsored by the IEEE Electron Devices Society in cooperation with the IEE; for 1990-<1992> by the Society |
| Hae kokoteksti | |